Metrology – 3 Dimensional Coordinate and
Surface Contour Measurement Systems
Our Zeiss CMM provides 3 Dimensional measurement capabilities with sub micron accuracy for complex parts with the highest tolerance requirements. High quality reporting of dimensional and geometrical requirements that are correlated to the customers drawing can be maintained with full traceability and distributed to the customer electronically as a final package.
The Taylor Hobson PGI 1230 system which provides nanometer measurement resolution offers surface contour measuring with unique software to produce final documentation of the measured results.
To complement our CNC measuring capability, PGS employs a full inventory of high precision traditional gages to compliment the CNC systems. The entire facility is calibrated in accordance with our AS9100C Quality Management System standards.